Invention Grant
US07700482B2 Patterned material layer, method of forming the same, microdevice, and method of manufacturing the same 失效
图案化材料层,其形成方法,微型装置及其制造方法

  • Patent Title: Patterned material layer, method of forming the same, microdevice, and method of manufacturing the same
  • Patent Title (中): 图案化材料层,其形成方法,微型装置及其制造方法
  • Application No.: US11364068
    Application Date: 2006-03-01
  • Publication No.: US07700482B2
    Publication Date: 2010-04-20
  • Inventor: Akifumi Kamijima
  • Applicant: Akifumi Kamijima
  • Applicant Address: unknown Tokyo
  • Assignee: TDK Corporation
  • Current Assignee: TDK Corporation
  • Current Assignee Address: unknown Tokyo
  • Agency: Oliff & Berridge, PLC
  • Priority: JP2005-111326 20050407
  • Main IPC: H01L21/44
  • IPC: H01L21/44
Patterned material layer, method of forming the same, microdevice, and method of manufacturing the same
Abstract:
A method of forming a patterned material layer, the method comprising: a resist layer forming step of forming a resist layer on a substrate, the resist layer including a first photosensitive resin layer, an intermediate resin layer, and a second photosensitive resin layer; an exposing step; a developing step of partly removing the resist layer so as to form a trench exposing the substrate and partly removing the intermediate resin layer so as to form a groove on a side face of the trench, thereby forming a resist frame; a vacuum coating step of forming a vacuum coating layer having a material pattern part covering the exposed part of the substrate and a part to lift off covering the resist frame; and a liftoff step of removing the part to lift off in the vacuum coating layer together with the resist frame, so as to yield a patterned material layer.
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