Invention Grant
- Patent Title: System and method for angular measurement
- Patent Title (中): 角度测量的系统和方法
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Application No.: US11131645Application Date: 2005-05-18
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Publication No.: US07701564B2Publication Date: 2010-04-20
- Inventor: Mike Babin , Stephen Eichblatt , Xiao Z. Wu
- Applicant: Mike Babin , Stephen Eichblatt , Xiao Z. Wu
- Applicant Address: NL Amsterdam
- Assignee: Hitachi Global Storage Technologies Netherlands B.V.
- Current Assignee: Hitachi Global Storage Technologies Netherlands B.V.
- Current Assignee Address: NL Amsterdam
- Main IPC: G01B11/26
- IPC: G01B11/26

Abstract:
Embodiments of the present invention include a method for measuring an angle between a first surface and a second surface of an object. The method includes rotating an object around a center axis of the object and shining a light source perpendicular to the center axis of the object. The method further includes measuring an intensity of a reflected light with respect to time and determining an angle between two or more surfaces of the object based on the intensity of the reflected light with respect to time.
Public/Granted literature
- US20060262294A1 System and method for angular measurement Public/Granted day:2006-11-23
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