A memory device driving circuit is disclosed which drives a memory device including a first electrode, a second electrode, and a memory layer interposed between the first electrode and the second electrode. The memory device driving circuit may include a main driver connected to the memory device, to drive the memory device, and a secondary driver connected between the memory device and the main driver, to control a set resistance of the memory device. The memory device driving circuit may freely adjust the set resistance of the memory device, to maintain the resistance of the memory device at a desired value. Accordingly, an improvement in the operation reliability of the memory device may be achieved.