Invention Grant
- Patent Title: Method and apparatus for localizing in-house wiring defects
- Patent Title (中): 用于本地化内部布线缺陷的方法和装置
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Application No.: US11366381Application Date: 2006-03-03
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Publication No.: US07702080B2Publication Date: 2010-04-20
- Inventor: Frank Cyriel Michel Defoort
- Applicant: Frank Cyriel Michel Defoort
- Applicant Address: FR Paris
- Assignee: Alcatel-Lucent
- Current Assignee: Alcatel-Lucent
- Current Assignee Address: FR Paris
- Agency: Harness, Dickey & Pierce
- Priority: EP05290496 20050304
- Main IPC: H04M1/24
- IPC: H04M1/24 ; H04M3/08 ; H04M3/22

Abstract:
The present invention relates to a method for localizing a defect in a in-house access plant operable to carry broadband communication services.A method according to the invention further comprises the steps of: instructing a user of said in-house access plant to manipulate in-house equipment through an automated and interactive communication session, determining timing information for each manipulation that is carried out, performing remote quality measurements over said in-house access plant while said in-house equipment are being manipulated, identifying from said timing information a particular manipulation that is time-correlated with a substantial change in measured quality, thereby identifying a particular piece of in-house equipment that has been manipulated and in the neighborhood of which said defect is located. The present invention also relates to an analysis tool such as a network analyzer, a communication unit such an intelligent voice responder or a web server, and to a diagnostic system.
Public/Granted literature
- US20060198500A1 Method and apparatus for localizing in-house wiring defects Public/Granted day:2006-09-07
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