Invention Grant
- Patent Title: Apparatus and method for testing data transfer rate
- Patent Title (中): 用于测试数据传输速率的装置和方法
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Application No.: US11782650Application Date: 2007-07-25
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Publication No.: US07702474B2Publication Date: 2010-04-20
- Inventor: Chiou-Lin Fan , Pao-Feng Huang , Chin-Feng Chen , Yuan-Hung Chien
- Applicant: Chiou-Lin Fan , Pao-Feng Huang , Chin-Feng Chen , Yuan-Hung Chien
- Applicant Address: TW Tu-Cheng, Taipei Hsien
- Assignee: Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: TW Tu-Cheng, Taipei Hsien
- Agent Frank R. Niranjan
- Priority: CN200610156908 20061117
- Main IPC: G01R29/02
- IPC: G01R29/02
Abstract:
A method for testing a data transfer rate of an electronic device includes: receiving data transmitted from the electronic device and converting the data into test data; analyzing the test data; encoding the analyzed data to generate output data; and displaying a state of the data transfer rate based on the output data.
Public/Granted literature
- US20080120067A1 APPARATUS AND METHOD FOR TESTING DATA TRANSFER RATE Public/Granted day:2008-05-22
Information query
