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US07702480B2 Manufacturing test and programming system 失效
制造测试和编程系统

  • Patent Title: Manufacturing test and programming system
  • Patent Title (中): 制造测试和编程系统
  • Application No.: US11718715
    Application Date: 2005-11-07
  • Publication No.: US07702480B2
    Publication Date: 2010-04-20
  • Inventor: David Beecher
  • Applicant: David Beecher
  • International Application: PCT/US2005/040369 WO 20051107
  • International Announcement: WO2006/052934 WO 20060518
  • Main IPC: G01R31/00
  • IPC: G01R31/00 ;  G01M19/00
Manufacturing test and programming system
Abstract:
A manufacturing test and programming system (100) is presented including providing a PCB tester (108), providing an in-system programmer (102) electrically attached to the PCB tester (108), mounting a device under test (114) having a programmable device (116) attached thereon and programming the programmable device (116) with the in-system programmer (102).
Abstract(Chinese):

提供制造测试和编程系统（100），包括提供PCB测试器（108），提供电连接到PCB测试器（108）的系统内编程器（102），安装被测器件（114），其具有可编程 设备（116），并且用可编程器件（116）与系统内编程器（102）进行编程。

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