Invention Grant
- Patent Title: System and method for metamodel-based gap analysis
- Patent Title (中): 基于元模型的差距分析的系统和方法
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Application No.: US11649430Application Date: 2007-01-04
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Publication No.: US07702643B2Publication Date: 2010-04-20
- Inventor: Ioan Mihai Oara
- Applicant: Ioan Mihai Oara
- Applicant Address: US MD Rockville
- Assignee: Micro Focus (US), Inc.
- Current Assignee: Micro Focus (US), Inc.
- Current Assignee Address: US MD Rockville
- Agency: Kokka & Backus, PC
- Main IPC: G06F17/00
- IPC: G06F17/00
Abstract:
A system and methods for comparing differences and similarities of at least two models including generating corresponding metamodel maps, visual representation of the models, and conducting a series of phases of comparison of the models using a mapping index, wherein the mapping index includes the metamodel maps and the visual representation of the models to produce a comparison output.
Public/Granted literature
- US20080168046A1 Gap analysis system & methods Public/Granted day:2008-07-10
Information query
