Invention Grant
US07702967B2 Method for monitoring an internal control signal of a memory device and apparatus therefor
有权
用于监视存储器件的内部控制信号的方法及其装置
- Patent Title: Method for monitoring an internal control signal of a memory device and apparatus therefor
- Patent Title (中): 用于监视存储器件的内部控制信号的方法及其装置
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Application No.: US12243292Application Date: 2008-10-01
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Publication No.: US07702967B2Publication Date: 2010-04-20
- Inventor: Ji Hyun Kim , Young Jun Nam
- Applicant: Ji Hyun Kim , Young Jun Nam
- Applicant Address: KR Kyoungki-do
- Assignee: Hynix Semiconductor Inc.
- Current Assignee: Hynix Semiconductor Inc.
- Current Assignee Address: KR Kyoungki-do
- Agency: Ladas & Parry LLP
- Priority: KR2004-34896 20040517
- Main IPC: G11B20/20
- IPC: G11B20/20

Abstract:
Disclosed is a method for monitoring an internal control signal of a memory device and an apparatus therefore. The method includes (a) generating a first signal having a first pulse width by a burst operation command, (b) receiving the first signal, and generating N−1 (where, N is a burst length) second signals having a second pulse width, (c) receiving the first signal and the second signals, and outputting a third signal by changing the first pulse width of the first signal and the second pulse width of the second signals in accordance with a variation of a frequency of a clock signal of the memory device, (d) outputting the third signal to an external pin of the memory device and monitoring the third signal, and (e) adjusting a pulse width of a signal that controls an operation of a data bus connecting a bit-line sense amplifier and a data sense amplifier using the third signal.
Public/Granted literature
- US20090024882A1 METHOD FOR MONITORING AN INTERNAL CONTROL SIGNAL OF A MEMORY DEVICE AND APPARATUS THEREFOR Public/Granted day:2009-01-22
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