Invention Grant
- Patent Title: Pressure sensor having a chamber and a method for fabricating the same
- Patent Title (中): 具有腔室的压力传感器及其制造方法
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Application No.: US11799822Application Date: 2007-05-03
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Publication No.: US07704774B2Publication Date: 2010-04-27
- Inventor: Felix Mayer , Johannes Bühler , Matthias Streiff , Robert Sunier
- Applicant: Felix Mayer , Johannes Bühler , Matthias Streiff , Robert Sunier
- Applicant Address: CH Stafa
- Assignee: Sensirion Holding AG
- Current Assignee: Sensirion Holding AG
- Current Assignee Address: CH Stafa
- Agency: Cooper & Dunham LLP
- Priority: EP06010606 20060523; EP07008470 20070426
- Main IPC: H01L21/00
- IPC: H01L21/00

Abstract:
A pressure sensor is manufactured by joining two wafers, the first wafer comprising CMOS circuitry and the second being an SOI wafer. A recess is formed in the top material layer of the first wafer, which is covered by the silicon layer of the second wafer to form a cavity. Part or all of the substrate of the second wafer is removed to forming a membrane from the silicon layer. Alternatively, the cavity can be formed in the second wafer. The second wafer is electrically connected to the circuitry on the first wafer. This design allows to use standard CMOS processes for integrating circuitry on the first wafer.
Public/Granted literature
- US20070275494A1 Pressure sensor having a chamber and a method for fabricating the same Public/Granted day:2007-11-29
Information query
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