Invention Grant
US07705458B2 Bulk metallic glass solders, foamed bulk metallic glass solders, foamed-solder bond pads in chip packages, methods of assembling same, and systems containing same 有权
散装金属玻璃焊料,泡沫块状金属玻璃焊料,芯片封装中的泡沫焊接焊盘,组装方法和含有其的体系

  • Patent Title: Bulk metallic glass solders, foamed bulk metallic glass solders, foamed-solder bond pads in chip packages, methods of assembling same, and systems containing same
  • Patent Title (中): 散装金属玻璃焊料,泡沫块状金属玻璃焊料,芯片封装中的泡沫焊接焊盘,组装方法和含有其的体系
  • Application No.: US11425353
    Application Date: 2006-06-20
  • Publication No.: US07705458B2
    Publication Date: 2010-04-27
  • Inventor: Daewoong SuhYongki Min
  • Applicant: Daewoong SuhYongki Min
  • Applicant Address: US CA Santa Clara
  • Assignee: Intel Corporation
  • Current Assignee: Intel Corporation
  • Current Assignee Address: US CA Santa Clara
  • Agent John N. Greaves
  • Main IPC: H01L23/488
  • IPC: H01L23/488
Bulk metallic glass solders, foamed bulk metallic glass solders, foamed-solder bond pads in chip packages, methods of assembling same, and systems containing same
Abstract:
A foamed bulk metallic glass electrical connection is formed on a substrate of an integrated circuit package. The foamed bulk metallic glass electrical connection exhibits a low modulus that resists cracking during shock and dynamic loading. The foamed bulk metallic glass electrical connection is used as a solder bump for communication between an integrated circuit device and external structures. A process of forming the foamed bulk metallic glass electrical connection includes mixing bulk metallic glass with a blowing agent.
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