Invention Grant
- Patent Title: Electronic device and method for on chip jitter measurement
- Patent Title (中): 用于片上抖动测量的电子设备和方法
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Application No.: US12134369Application Date: 2008-06-06
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Publication No.: US07705581B2Publication Date: 2010-04-27
- Inventor: Franz Hermann
- Applicant: Franz Hermann
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Agent Yingsheng Tung; Wade J. Brady, III; Frederick J. Telecky, Jr.
- Main IPC: G01R23/12
- IPC: G01R23/12 ; H03L7/06

Abstract:
The present invention relates to an integrated electronic device for digital signal processing, which includes a reference clock input for receiving a reference clock, a phase locked loop (PLL), a phase interpolator (PI) coupled to the phase locked loop (PLL) for shifting a phase of an output clock signal of the PLL in a stepwise manner so as to generate a shifted output clock signal (PHI_out), a logic stage for determining the state of the reference clock signal (REF_CLK) multiple times during an edge of the shifted output clock for each phase shift, a storing means for storing information whether or not the determined state of the reference clock signal (REF_CLK) is stable for a phase of the shifted output clock signal (PHI_out), and an interface configured to read out the stored information for determining the jitter of the shifted output clock signal (PHI_OUT).
Public/Granted literature
- US20080309319A1 Electronic Device and Method for on Chip Jitter Measurement Public/Granted day:2008-12-18
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