Invention Grant
- Patent Title: Signal converting apparatus with built-in self test
- Patent Title (中): 信号转换装置内置自检
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Application No.: US11965752Application Date: 2007-12-28
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Publication No.: US07705755B2Publication Date: 2010-04-27
- Inventor: Chao-Chi Yang , Yao-Ren Fan
- Applicant: Chao-Chi Yang , Yao-Ren Fan
- Applicant Address: TW Science Industrial Park, HsinChu
- Assignee: Elan Microelectronics Corporation
- Current Assignee: Elan Microelectronics Corporation
- Current Assignee Address: TW Science Industrial Park, HsinChu
- Agent Winston Hsu
- Priority: TW95149868A 20061229; TW96148639A 20071219
- Main IPC: H03M1/10
- IPC: H03M1/10

Abstract:
The present invention provides a signal converting apparatus with built-in self test, including a first signal converting circuit, a second signal converting circuit, a comparing apparatus, a control logic apparatus and a voltage divider. The first and the second signal converting circuit take a first and a second reference voltage and are respectively controlled by a first and second set of control signals from the control logic apparatus for the comparing apparatus to generate a comparing result.
Public/Granted literature
- US20080158028A1 SIGNAL CONVERTING APPARATUS WITH BUILT-IN SELF TEST Public/Granted day:2008-07-03
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