Invention Grant
- Patent Title: Metrology system with spectroscopic ellipsometer and photoacoustic measurements
- Patent Title (中): 光谱椭偏仪和光声测量的计量系统
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Application No.: US12381477Application Date: 2009-03-11
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Publication No.: US07705974B2Publication Date: 2010-04-27
- Inventor: Robert Gregory Wolf , Christopher Morath , Robin Mair
- Applicant: Robert Gregory Wolf , Christopher Morath , Robin Mair
- Applicant Address: US NJ Flanders
- Assignee: Rudolph Technologies, Inc.
- Current Assignee: Rudolph Technologies, Inc.
- Current Assignee Address: US NJ Flanders
- Agency: Harrington & Smith
- Main IPC: G01N21/00
- IPC: G01N21/00

Abstract:
An optical system includes both a microspot broadband spectroscopic ellipsometer and a photoacoustic film thickness measurement system that are supplied laser light by the same laser light source. One of the systems makes a measurement, the result of which is used to adjust a parameter of the other system; e.g. the ellipsometer measures thickness and the photoacoustic system uses the thickness result to measure the speed of sound. In one version, the ellipsometer converts the laser beam to a broad-spectrum beam that provides higher intensity.
Public/Granted literature
- US20090201502A1 Metrology system with spectroscopic ellipsometer and photoacoustic measurements Public/Granted day:2009-08-13
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