Invention Grant
- Patent Title: Method for recognizing patterns from assay results
- Patent Title (中): 从测定结果识别模式的方法
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Application No.: US11443998Application Date: 2006-05-31
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Publication No.: US07705976B2Publication Date: 2010-04-27
- Inventor: Peter R. Robrish
- Applicant: Peter R. Robrish
- Applicant Address: US CA San Jose
- Assignee: Alverix, Inc.
- Current Assignee: Alverix, Inc.
- Current Assignee Address: US CA San Jose
- Agency: K&L Gates, LLP
- Main IPC: G01M11/00
- IPC: G01M11/00
Abstract:
A Fourier transform optical detection system for use with a test assay that has a sensitivity pattern, the detection system including a lens having a Fourier transform plane and detectors located in the Fourier transform plane positioned in an arrangement of a Fourier transform pattern of the sensitivity pattern.
Public/Granted literature
- US20070279620A1 Method for recognizing patterns from assay results Public/Granted day:2007-12-06
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