Invention Grant
- Patent Title: Method and apparatus for inspection of multi-junction solar cells
- Patent Title (中): 多结太阳能电池检查方法和装置
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Application No.: US11348019Application Date: 2006-02-06
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Publication No.: US07705978B2Publication Date: 2010-04-27
- Inventor: Mau-Song Chou , Jonathan W. Arenberg , Mark A. Menard
- Applicant: Mau-Song Chou , Jonathan W. Arenberg , Mark A. Menard
- Applicant Address: US CA Los Angeles
- Assignee: Northrop Grumman Corporation
- Current Assignee: Northrop Grumman Corporation
- Current Assignee Address: US CA Los Angeles
- Agency: Carmen Patti Law Group, LLC
- Main IPC: G01N21/88
- IPC: G01N21/88 ; G02F1/01

Abstract:
A technique for providing high-contrast images of defects in solar cells and solar panels, by illuminating each cell under inspection with broadband infrared radiation, and then forming an image of radiation that is secularly reflected from the cell. Multi-junction solar cells have a metal backing layer that secularly reflects the illumination back into an appropriately positioned and aligned camera, selected to be sensitive to infrared wavelengths at which the solar cell materials are relatively transparent.
Public/Granted literature
- US20070181180A1 Methods and apparatus for inspection of multi-junction solar cells Public/Granted day:2007-08-09
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