Invention Grant
- Patent Title: Voltage generating circuits for semiconductor memory devices and methods for the same
- Patent Title (中): 用于半导体存储器件的电压产生电路及其方法
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Application No.: US12010465Application Date: 2008-01-25
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Publication No.: US07706192B2Publication Date: 2010-04-27
- Inventor: Young-Sun Min , Dong-Il Seo
- Applicant: Young-Sun Min , Dong-Il Seo
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: KR10-2007-0007788 20070125
- Main IPC: G11C5/01
- IPC: G11C5/01

Abstract:
In a voltage generating circuit for a semiconductor memory device, each of a plurality of reset signal generators individually generates a reset signal in response to one of a plurality of external source voltages. The plurality of external source voltages have different voltage levels. An output voltage generator generates a plurality of output voltages by independently driving each of the plurality of external source voltages in response to a corresponding one of the plurality of reset signals. The output voltage generator outputs the plurality of output voltages through a common output terminal.
Public/Granted literature
- US20080212381A1 Voltage generating circuits for semiconductor memory devices and methods for the same Public/Granted day:2008-09-04
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