Invention Grant
- Patent Title: Online wavefront measurement and display
- Patent Title (中): 在线波前测量和显示
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Application No.: US10565703Application Date: 2004-07-22
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Publication No.: US07708411B2Publication Date: 2010-05-04
- Inventor: Hans-Joachim Polland , Gerhard Youssefi , Stefan Seitz
- Applicant: Hans-Joachim Polland , Gerhard Youssefi , Stefan Seitz
- Applicant Address: US NY Rochester
- Assignee: Bausch & Lomb Incorporated
- Current Assignee: Bausch & Lomb Incorporated
- Current Assignee Address: US NY Rochester
- Agent Jeffrey B. Powers
- Priority: DE10333813 20030724
- International Application: PCT/EP2004/008205 WO 20040722
- International Announcement: WO2005/015495 WO 20050217
- Main IPC: A61B3/00
- IPC: A61B3/00

Abstract:
A fast algorithm is presented which allows for substantially simultaneous acquisition, analysis, and display of a wavefront centroid image, referred to as online aberrometry. A method embodiment involves determination of an average, or most frequently occurring, wavefront aberration over a selected time interval, e.g., 20 sec. Online pupil diameter measurement allows analysis of wavefront aberration as a function of changing pupil size. A wavefront measuring apparatus is disclosed that supports online aberrometry.
Public/Granted literature
- US20070008491A1 Online wavefront measurement and display Public/Granted day:2007-01-11
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