Invention Grant
- Patent Title: Integrated analytical test element
- Patent Title (中): 综合分析测试元件
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Application No.: US11691674Application Date: 2007-03-27
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Publication No.: US07708703B2Publication Date: 2010-05-04
- Inventor: Charles C. Raney , Steven N. Roe
- Applicant: Charles C. Raney , Steven N. Roe
- Applicant Address: US IN Indianapolis
- Assignee: Roche Diagnostics Operations, Inc.
- Current Assignee: Roche Diagnostics Operations, Inc.
- Current Assignee Address: US IN Indianapolis
- Agency: Woodard, Emhardt, Moriarty, McNett & Henry LLP
- Main IPC: A61B5/00
- IPC: A61B5/00 ; A61B17/14 ; A61B17/32 ; B65D81/00

Abstract:
A lancet integrated test element (LIT) includes an incision forming member that has a cutting end configured to form an incision in tissue. A test element is attached to the incision forming member to test fluid from the incision. The test element has a sampling end with a sample opening through which the fluid is collected. The test element is bendable from a first state where the cutting end of the incision forming member is retracted from the sampling end of the test element to a second state where at least a portion of the cutting extends past the sampling end of the test element to form the incision in the tissue.
Public/Granted literature
- US20070191738A1 INTEGRATED ANALYTICAL TEST ELEMENT Public/Granted day:2007-08-16
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