Invention Grant
US07709063B2 Remote plasma apparatus for processing substrate with two types of gases
有权
用于处理具有两种类型气体的基板的远程等离子体装置
- Patent Title: Remote plasma apparatus for processing substrate with two types of gases
- Patent Title (中): 用于处理具有两种类型气体的基板的远程等离子体装置
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Application No.: US11620518Application Date: 2007-01-05
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Publication No.: US07709063B2Publication Date: 2010-05-04
- Inventor: Katsuhisa Yuda , Hiroshi Nogami
- Applicant: Katsuhisa Yuda , Hiroshi Nogami
- Applicant Address: JP JP
- Assignee: NEC Corporation,Canon Anelva Corporation
- Current Assignee: NEC Corporation,Canon Anelva Corporation
- Current Assignee Address: JP JP
- Agency: Hayes Soloway P.C.
- Priority: JP2000-196619 20000629
- Main IPC: H05H1/24
- IPC: H05H1/24 ; C23C16/00

Abstract:
In a plasma CVD apparatus, a plate formed with a plurality of perforated holes is arranged to separate a plasma generation region and a processing region. The aperture ratio of the perforated holes to the plate is not greater than five percent. Plasma including radicals and excited species is generated from an oxygen (O2) gas in the plasma generation region, then the radicals and excited species flow into the processing region through the perforated holes. A monosilane (SiH4) gas is also supplied into the processing region, but the backward flow of the monosilane gas into the plasma generation region is suppressed by the plate. In the processing region, the radicals and the excited species and the monosilane gas result in a gas phase reaction that yields the silicon dioxide film formed on the substrate or the wafer with high quality.
Public/Granted literature
- US20070110918A1 REMOTE PLASMA APPARATUS FOR PROCESSING SUBSTRATE WITH TWO TYPES OF GASES Public/Granted day:2007-05-17
Information query
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