Invention Grant
- Patent Title: Method for producing semiconductor device
- Patent Title (中): 半导体器件的制造方法
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Application No.: US11893458Application Date: 2007-08-16
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Publication No.: US07709353B2Publication Date: 2010-05-04
- Inventor: Hideki Ono , Satoshi Taniguchi
- Applicant: Hideki Ono , Satoshi Taniguchi
- Applicant Address: JP Tokyo
- Assignee: Sony Corporation
- Current Assignee: Sony Corporation
- Current Assignee Address: JP Tokyo
- Agency: Rockey, Depke & Lyons, LLC.
- Agent Robert J. Depke
- Priority: JPP2006-224845 20060822
- Main IPC: H01L21/46
- IPC: H01L21/46

Abstract:
A method for producing a semiconductor device includes the steps of forming a predetermined device in a device layer grown on a semiconductor substrate with a sacrificial layer provided therebetween; and removing the sacrificial layer by etching to separate the semiconductor substrate from the device layer while a supporting substrate is bonded to the side of the device layer, wherein in the step of removing the sacrificial layer, a groove extending from the device layer to the sacrificial layer is formed before the sacrificial layer is removed, and the etching solution is allowed to penetrate to the sacrificial layer through the groove.
Public/Granted literature
- US20080050858A1 Method for producing semiconductor device Public/Granted day:2008-02-28
Information query
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