Invention Grant
- Patent Title: Particle beam irradiation apparatus and particle beam irradiation method
- Patent Title (中): 粒子束照射装置和粒子束照射方法
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Application No.: US11239073Application Date: 2005-09-30
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Publication No.: US07709818B2Publication Date: 2010-05-04
- Inventor: Koji Matsuda , Kazuo Hiramoto , Kunio Moriyama
- Applicant: Koji Matsuda , Kazuo Hiramoto , Kunio Moriyama
- Applicant Address: JP Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Dickstein Shapiro LLP
- Priority: JP2004-286234 20040930; JP2005-96672 20050330
- Main IPC: A61N5/10
- IPC: A61N5/10

Abstract:
To ensure irradiation accuracy and safety, even when an irradiation device employing a different irradiation method is used, disclosed is herein a charged particle beam irradiation apparatus that irradiates an irradiation target with charged particle beams includes: a charged particle beam generator for generating the charged particle beams; a passive scattering irradiation device and a scanning irradiation device, both for irradiating the irradiation target with the charged particle beams; a beam transport system for transporting the charged particles beam extracted from the charged particle beam generator, to selected one of the two irradiation devices; and a central controller that modifies operating parameters on the charged particle beam generator, according to the irradiation method adopted for the selected irradiation device.
Public/Granted literature
- US20060076515A1 Particle beam irradiation apparatus and particle beam irradiation method Public/Granted day:2006-04-13
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