Invention Grant
- Patent Title: Conductive probe and method for producing the same
- Patent Title (中): 导电探针及其制造方法
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Application No.: US11734303Application Date: 2007-04-12
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Publication No.: US07710012B2Publication Date: 2010-05-04
- Inventor: Tadashi Fujieda , Kishio Hidaka , Mitsuo Hayashibara
- Applicant: Tadashi Fujieda , Kishio Hidaka , Mitsuo Hayashibara
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Antonelli, Terry, Stout & Kraus, LLP.
- Priority: JP2006-111499 20060414
- Main IPC: H01J1/62
- IPC: H01J1/62 ; H01J1/00

Abstract:
An amorphous carbon layer sticking on a carbon nanotube surface is remarkably reduced when a carbon nanotube is joined to a conductive substrate by bringing a single fibrous carbonaceous material in contact with the tip of the conductive substrate and covering at least a part of the contact portion with a conductive material while at lest either of the fibrous carbonaceous material or the conductive substrate is heated in a vacuum.
Public/Granted literature
- US20080067407A1 CONDUCTIVE PROBE AND METHOD FOR PRODUCING THE SAME Public/Granted day:2008-03-20
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