Invention Grant
- Patent Title: Voltage variance tester
- Patent Title (中): 电压方差测试仪
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Application No.: US12045673Application Date: 2008-03-10
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Publication No.: US07710123B2Publication Date: 2010-05-04
- Inventor: Jin-Liang Xiong
- Applicant: Jin-Liang Xiong
- Applicant Address: CN Shenzhen, Guangdong Province TW Tu-Cheng, Taipei Hsien
- Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: CN Shenzhen, Guangdong Province TW Tu-Cheng, Taipei Hsien
- Agent Frank R. Niranjan
- Priority: CN200710203527 20071228
- Main IPC: H01H31/02
- IPC: H01H31/02 ; G01R31/02

Abstract:
An exemplary voltage variance tester includes a first to a third testing circuits each comprising an adjustable power source and an electrical switch; a first to a third signal generators providing a first to a third signals respectively; a connector having a first to a third terminals connected to the first to the third testing circuits respectively for receiving the adjustable power sources, a fourth to a sixth terminals connected to the first to the third signal generators for receiving the first to the third signals, and a seventh terminal; and a control circuit connected to the seventh terminal of the connector for receiving a power on signal to turn on the first to third electrical switch, wherein, voltage variances of the motherboard are tested by adjusting the first to the third adjustable power sources.
Public/Granted literature
- US20090167318A1 VOLTAGE VARIANCE TESTER Public/Granted day:2009-07-02
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