Invention Grant
US07710130B2 Volume resistivity measurement apparatus for dielectric layer of electrostatic chuck and measurement method using the apparatus 有权
静电卡盘电介质体积电阻率测量装置及使用该装置的测量方法

  • Patent Title: Volume resistivity measurement apparatus for dielectric layer of electrostatic chuck and measurement method using the apparatus
  • Patent Title (中): 静电卡盘电介质体积电阻率测量装置及使用该装置的测量方法
  • Application No.: US11954386
    Application Date: 2007-12-12
  • Publication No.: US07710130B2
    Publication Date: 2010-05-04
  • Inventor: Minoru YokotaKazuhiro Nobori
  • Applicant: Minoru YokotaKazuhiro Nobori
  • Applicant Address: JP Nagoya
  • Assignee: NGK Insulators, Ltd.
  • Current Assignee: NGK Insulators, Ltd.
  • Current Assignee Address: JP Nagoya
  • Agency: Burr & Brown
  • Priority: JP2006-338469 20061215
  • Main IPC: G01R27/02
  • IPC: G01R27/02
Volume resistivity measurement apparatus for dielectric layer of electrostatic chuck and measurement method using the apparatus
Abstract:
A pair of conductive rubber electrodes including measurement surfaces opposite to a surface of a dielectric layer of an electrostatic chuck as an objective of measurement, in which the measurement surfaces are arranged at an interval individually on the same plane, are provided. A direct-current power supply and an ammeter are connected to the pair of conductive rubber electrodes. The conductive rubber electrodes have resistance values equal to each other, and have a shape in which the measurement surfaces have areas equal to each other, in which volume resistivities are 1×105 Ω·cm or less, and hardness is within a range of 60 to 80 Hs in JIS-A hardness. An interval between the conductive rubber electrodes is six times or more a thickness of the dielectric layer of the electrostatic chuck as the objective of the measurement.
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