Invention Grant
- Patent Title: Volume resistivity measurement apparatus for dielectric layer of electrostatic chuck and measurement method using the apparatus
- Patent Title (中): 静电卡盘电介质体积电阻率测量装置及使用该装置的测量方法
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Application No.: US11954386Application Date: 2007-12-12
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Publication No.: US07710130B2Publication Date: 2010-05-04
- Inventor: Minoru Yokota , Kazuhiro Nobori
- Applicant: Minoru Yokota , Kazuhiro Nobori
- Applicant Address: JP Nagoya
- Assignee: NGK Insulators, Ltd.
- Current Assignee: NGK Insulators, Ltd.
- Current Assignee Address: JP Nagoya
- Agency: Burr & Brown
- Priority: JP2006-338469 20061215
- Main IPC: G01R27/02
- IPC: G01R27/02

Abstract:
A pair of conductive rubber electrodes including measurement surfaces opposite to a surface of a dielectric layer of an electrostatic chuck as an objective of measurement, in which the measurement surfaces are arranged at an interval individually on the same plane, are provided. A direct-current power supply and an ammeter are connected to the pair of conductive rubber electrodes. The conductive rubber electrodes have resistance values equal to each other, and have a shape in which the measurement surfaces have areas equal to each other, in which volume resistivities are 1×105 Ω·cm or less, and hardness is within a range of 60 to 80 Hs in JIS-A hardness. An interval between the conductive rubber electrodes is six times or more a thickness of the dielectric layer of the electrostatic chuck as the objective of the measurement.
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