Invention Grant
- Patent Title: Delay apparatus for delay locked loop
- Patent Title (中): 延迟锁定环延迟装置
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Application No.: US11819632Application Date: 2007-06-28
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Publication No.: US07710178B2Publication Date: 2010-05-04
- Inventor: Sun-Hyuck Yon
- Applicant: Sun-Hyuck Yon
- Applicant Address: KR Gyeonggi-do
- Assignee: Hynix Semiconductor Inc.
- Current Assignee: Hynix Semiconductor Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Venable LLP
- Agent Jeffri A. Kaminski
- Priority: KR10-2006-0124460 20061208
- Main IPC: H03K3/00
- IPC: H03K3/00 ; H03H11/16 ; H03K5/13

Abstract:
A delay apparatus for a delay locked loop includes a plurality of delay devices that are formed by modeling a plurality of signal processing structures through which a delay locked loop clock output from a delay locked loop reaches an output circuit of a semiconductor memory apparatus from an output terminal of the delay locked loop. At least one of the plurality of delay devices is composed of a variable delay device in which a delay time varies according to a change in operation voltage.
Public/Granted literature
- US20080136477A1 Delay apparatus for delay locked loop Public/Granted day:2008-06-12
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