Invention Grant
- Patent Title: Analog-to-digital converter offset and gain calibration using internal voltage references
- Patent Title (中): 使用内部电压基准的模数转换器偏移和增益校准
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Application No.: US12051170Application Date: 2008-03-19
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Publication No.: US07710303B2Publication Date: 2010-05-04
- Inventor: Igor Wojewoda , Gaurang Kavaiya , Tim Phoenix
- Applicant: Igor Wojewoda , Gaurang Kavaiya , Tim Phoenix
- Applicant Address: US AZ Chandler
- Assignee: Microchip Technology Incorporated
- Current Assignee: Microchip Technology Incorporated
- Current Assignee Address: US AZ Chandler
- Agency: King & Spalding L.L.P.
- Main IPC: H03M1/12
- IPC: H03M1/12

Abstract:
A mixed signal device having an analog-to-digital converter (ADC) with offset and gain calibration using internal voltage references whereby the digital processor calibrates out offset and gain errors in the analog-to-digital converter by adjusting the analog input amplifier gain and offset or with software compensating the digital representations of the voltages measured. Two different known voltage values are used in determining the offset and gain adjustments needed to calibrate the ADC against the two know voltage values. The mixed signal device may further comprise a Bandgap voltage reference having an accurate known voltage value. Wherein the Bandgap voltage reference may be used for further offset and gain calibration of the ADC to produce substantially absolute voltage values.
Public/Granted literature
- US20080278359A1 Analog-to-Digital Converter Offset and Gain Calibration Using Internal Voltage References Public/Granted day:2008-11-13
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