Invention Grant
- Patent Title: Nonvolatile ferroelectric memory device
- Patent Title (中): 非易失性铁电存储器件
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Application No.: US11526776Application Date: 2006-09-26
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Publication No.: US07710759B2Publication Date: 2010-05-04
- Inventor: Hee Bok Kang , Jin Hong Ahn
- Applicant: Hee Bok Kang , Jin Hong Ahn
- Applicant Address: KR Gyeonggi-do
- Assignee: Hynix Semiconductor, Inc.
- Current Assignee: Hynix Semiconductor, Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: IP & T Law Firm PLC
- Priority: KR10-2005-0096567 20051013
- Main IPC: G11C11/22
- IPC: G11C11/22

Abstract:
A nonvolatile ferroelectric memory device includes a plurality of memory cells connected serially between a bit line and a sensing line, a first switching unit configured to selectively connect the memory cells to the bit line in response to a first selecting signal, and a second switching unit configured to selectively connect the memory cells to the sensing line in response to a second selecting signal. The first switching unit and the second switching unit have the same structure as that of the memory cell.
Public/Granted literature
- US20070086231A1 Nonvolatile ferroelectric memory device Public/Granted day:2007-04-19
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