Invention Grant
- Patent Title: Nonvolatile semiconductor memory, method for reading out thereof, and memory card
- Patent Title (中): 非易失性半导体存储器,读出方法和存储卡
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Application No.: US12361362Application Date: 2009-01-28
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Publication No.: US07710779B2Publication Date: 2010-05-04
- Inventor: Makoto Iwai , Yoshihisa Watanabe
- Applicant: Makoto Iwai , Yoshihisa Watanabe
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2005-327725 20051111; JP2005-354034 20051207
- Main IPC: G11C16/04
- IPC: G11C16/04

Abstract:
A nonvolatile semiconductor memory includes: a memory cell unit including a plurality of memory cells having an electric charge accumulation layer and a control electrode, said memory cells being electrically connected in series; a plurality of word lines, each of which is electrically connected to said control electrode of said plurality of memory cells; a source line electrically connected to said memory cells at one end of said memory cell unit; a bit line electrically connected to said memory cells at the other end of said memory cell unit; and a control signal generation circuit, which during a data readout operation staggers a timing for selecting the word line connected to said memory cells of said memory cell unit from a timing for selecting a non-selected word line connected to a non-selected memory.
Public/Granted literature
- US20090154241A1 NONVOLATILE SEMICONDUCTOR MEMORY, METHOD FOR READING OUT THEREOF, AND MEMORY CARD Public/Granted day:2009-06-18
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