Invention Grant
- Patent Title: Method of reading the bits of nitride read-only memory cell
- Patent Title (中): 读取氮化物只读存储单元的位的方法
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Application No.: US12149350Application Date: 2008-04-30
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Publication No.: US07710784B2Publication Date: 2010-05-04
- Inventor: Chi-Ling Chu , Hsien-Wen Hsu , Jian-Yuan Shen
- Applicant: Chi-Ling Chu , Hsien-Wen Hsu , Jian-Yuan Shen
- Applicant Address: TW Hsinchu
- Assignee: Macronix International Co., Ltd.
- Current Assignee: Macronix International Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: TW94117304A 20050526
- Main IPC: G11C11/34
- IPC: G11C11/34

Abstract:
A nitride trapping memory device includes a comparator, a bias unit, a memory cell, a cycling cell, a compensation cell and a control unit. The comparator has a reference voltage. The bias unit is for outputting a bias voltage to the comparator, and the comparator outputs a bit value according to comparison of the bias voltage and the reference voltage. The memory cell is connected to the bias unit via a first switch. The cycling cell is connected to the bias unit via a second switch. The compensation cell is connected to the bias unit via a third switch. The control unit is for controlling the cycling cell and the compensation cell according to the bit value.
Public/Granted literature
- US20080205135A1 Method of reading the bits of nitride read-only memory cell Public/Granted day:2008-08-28
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