A non-volatile semiconductor memory device may include a memory cell array that may include a plurality of memory transistors; a input circuit that may control a voltage level of an internal reference voltage and a delay time of an internal clock signal in response to an MRS trim code or an electric fuse trim code, and that may generate a first buffered input signal; a column gate that may gate the first buffered input signal in response to a decoded column address signal; and a sense amplifier that may amplify an output signal of the memory cell array to output to the column gate, and that may receive an output signal of the column gate to output to the memory cell array. The non-volatile semiconductor memory device may properly buffer an input signal of a small swing range.