Invention Grant
- Patent Title: Processes and a device for determining the actual position of a structure of an object to be examined
- Patent Title (中): 用于确定被检查物体的结构的实际位置的过程和装置
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Application No.: US12157103Application Date: 2008-06-06
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Publication No.: US07711084B2Publication Date: 2010-05-04
- Inventor: Mario Schroeder , Wolfram Schmidt
- Applicant: Mario Schroeder , Wolfram Schmidt
- Applicant Address: DE Saarwellingen
- Assignee: MYCRONA Gesellschaft fur innovative Messtechnik GmbH
- Current Assignee: MYCRONA Gesellschaft fur innovative Messtechnik GmbH
- Current Assignee Address: DE Saarwellingen
- Agent Horst M. Kasper
- Priority: DE10231896 20020712
- Main IPC: A61B6/03
- IPC: A61B6/03

Abstract:
A CT scanner is employed having a first coordinate system called the CT coordinate system related to the CT scanner for determining an actual position of a structure of an object to be examined. A coordinate measuring instrument (MI) is employed which is either a tactile or an optical or multisensor or an ultrasonic coordinate measuring instrument and which has a second coordinate system, the MI coordinate system, related to said coordinate measuring instrument. According to a variant, a) the coordinates of the object are determined in the MI coordinate system, b) the target position of the structure is predefined, c) after steps a) and b) the target position is determined in the MI coordinate system, d) and, the object is positioned in such a way that the target position of the structure comes to lie within a volume detected by the CT scanner using the result of step c).
Public/Granted literature
- US20080285710A1 Processes and a device for determining the actual position of a structure of an object to be examined Public/Granted day:2008-11-20
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