Invention Grant
US07711084B2 Processes and a device for determining the actual position of a structure of an object to be examined 有权
用于确定被检查物体的结构的实际位置的过程和装置

Processes and a device for determining the actual position of a structure of an object to be examined
Abstract:
A CT scanner is employed having a first coordinate system called the CT coordinate system related to the CT scanner for determining an actual position of a structure of an object to be examined. A coordinate measuring instrument (MI) is employed which is either a tactile or an optical or multisensor or an ultrasonic coordinate measuring instrument and which has a second coordinate system, the MI coordinate system, related to said coordinate measuring instrument. According to a variant, a) the coordinates of the object are determined in the MI coordinate system, b) the target position of the structure is predefined, c) after steps a) and b) the target position is determined in the MI coordinate system, d) and, the object is positioned in such a way that the target position of the structure comes to lie within a volume detected by the CT scanner using the result of step c).
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