Invention Grant
US07711189B2 Layout analysis program, layout analysis apparatus and layout analysis method
有权
布局分析程序,布局分析仪器和布局分析方法
- Patent Title: Layout analysis program, layout analysis apparatus and layout analysis method
- Patent Title (中): 布局分析程序,布局分析仪器和布局分析方法
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Application No.: US11384327Application Date: 2006-03-21
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Publication No.: US07711189B2Publication Date: 2010-05-04
- Inventor: Yutaka Katsuyama , Hiroaki Takebe , Koji Kurokawa , Katsuhito Fujimoto
- Applicant: Yutaka Katsuyama , Hiroaki Takebe , Koji Kurokawa , Katsuhito Fujimoto
- Applicant Address: JP Kawasaki
- Assignee: Fujitsu Limited
- Current Assignee: Fujitsu Limited
- Current Assignee Address: JP Kawasaki
- Agency: Staas & Halsey LLP
- Priority: JP2005-366466 20051220
- Main IPC: G06K9/34
- IPC: G06K9/34 ; G06K9/46 ; G06K9/00

Abstract:
A layout analysis program, a layout analysis apparatus, layout analysis method and a medium can highly accurately extract a text block from an image if the image is a color image. The layout analysis program causes a computer to execute a divided region extracting step that extracts a region partitioned by a pattern according to a binary image so as to use the outcome of extraction as divided region, a set of character elements extracting step that extracts a set of the character elements extracted by a first binary image layout analysis process for each extracted divided region so as to use the outcome of extraction as set of character elements, a text block extracting step that extracts a region including the extracted set of character elements in each divided region so as to avoid overlapping the non-character elements extracted by a second binary image layout analysis process and use the outcome of extraction as text block and a layout information generating step that generates layout information according to the text block and the non-character elements extracted by the second binary image layout analysis process.
Public/Granted literature
- US20070140560A1 Layout analysis program, layout analysis apparatus and layout analysis method Public/Granted day:2007-06-21
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