Invention Grant
- Patent Title: Optical transceiver tester
- Patent Title (中): 光收发器测试仪
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Application No.: US12274262Application Date: 2008-11-19
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Publication No.: US07711265B2Publication Date: 2010-05-04
- Inventor: Brad L. Inman , Jan P. Peeters Weem , Rob J. Hensel
- Applicant: Brad L. Inman , Jan P. Peeters Weem , Rob J. Hensel
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Blakely, Sokoloff, Taylor & Zafman LLP
- Main IPC: H04B10/08
- IPC: H04B10/08 ; H04B17/00

Abstract:
In embodiments of the present invention, an optical device tester performs stressed eye testing on several optical receivers and transmission and dispersion penalty testing on optical transmitters at a variety of data rates wavelengths using single mode optical signals and multimode optical signals using a variety of supply voltages and temperatures.
Public/Granted literature
- US20090074405A1 OPTICAL TRANSCEIVER TESTER Public/Granted day:2009-03-19
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