Invention Grant
- Patent Title: System and method for automated parameter measurement
- Patent Title (中): 用于自动参数测量的系统和方法
-
Application No.: US11872756Application Date: 2007-10-16
-
Publication No.: US07711515B2Publication Date: 2010-05-04
- Inventor: Michael P. Burdett , Daniel Reich , Stolyarov Yury Sergeyevich
- Applicant: Michael P. Burdett , Daniel Reich , Stolyarov Yury Sergeyevich
- Applicant Address: US AZ Tucson
- Assignee: Current Energy Controls, LP
- Current Assignee: Current Energy Controls, LP
- Current Assignee Address: US AZ Tucson
- Agency: Baker Botts L.L.P.
- Main IPC: G01K17/00
- IPC: G01K17/00 ; G08B17/00

Abstract:
In accordance with the present invention, a method for automated parameter measurement includes strategically positioning an identifier tag at a location proximate a first object. The identifier tag stores location-specific information associated with the first object. A sensor in communications with the identifier tag receives the location-specific information from the identifier tag. Additionally, the sensor is used to collect quantitative data associated with a first parameter from the first object. The location-specific information received from the first identifier tag is used to process the quantitative data.
Public/Granted literature
- US20080103723A1 System and Method for Automated Parameter Measurement Public/Granted day:2008-05-01
Information query