Invention Grant
- Patent Title: System and method for testing the accuracy of real time clocks
- Patent Title (中): 用于测试实时时钟精度的系统和方法
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Application No.: US12107784Application Date: 2008-04-23
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Publication No.: US07711517B2Publication Date: 2010-05-04
- Inventor: Ming-Shiu Ou Yang , Wei-Yuan Chen
- Applicant: Ming-Shiu Ou Yang , Wei-Yuan Chen
- Applicant Address: TW Tu-Cheng, Taipei Hsien
- Assignee: Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: TW Tu-Cheng, Taipei Hsien
- Agent Frank R. Niranjan
- Priority: CN200710201397 20070820
- Main IPC: G04F1/00
- IPC: G04F1/00

Abstract:
A method for testing the accuracy of real time clocks is disclosed. The method includes the steps of: setting test parameters for testing the accuracy of real time clocks (RTCs), the test parameters comprising a test time length, a test time sampling interval, and an acceptable margin; synchronizing the time of an RTC IC and an RTC to be tested via a UUT; reading a current time of the RTC IC and the RTC via the UUT at each test time sampling interval; calculating a time difference between the current time of the RTC IC and the RTC via the UUT, and measuring whether the absolute value of the time difference is less than the acceptable margin; detecting whether the test time length is over; repeating the test process if the test time length is not over, or outputting test pass information if the test time length is over. A related system is also disclosed.
Public/Granted literature
- US20090055125A1 SYSTEM AND METHOD FOR TESTING THE ACCURACY OF REAL TIME CLOCKS Public/Granted day:2009-02-26
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