Invention Grant
- Patent Title: Static analysis to identify defects in grammars
- Patent Title (中): 静态分析来识别语法中的缺陷
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Application No.: US11151576Application Date: 2005-06-13
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Publication No.: US07711551B2Publication Date: 2010-05-04
- Inventor: Ricardo Lopez-Barquilla , Craig Campbell
- Applicant: Ricardo Lopez-Barquilla , Craig Campbell
- Applicant Address: US WA Redmond
- Assignee: Microsoft Corporation
- Current Assignee: Microsoft Corporation
- Current Assignee Address: US WA Redmond
- Agency: Westman, Champlin & Kelly, P.A.
- Agent Joseph R. Kelly
- Main IPC: G06F17/27
- IPC: G06F17/27 ; G10L11/00 ; G10L21/00
Abstract:
The present invention provides static analysis of speech grammars prior to the speech grammars being deployed in a speech system.
Public/Granted literature
- US20060282267A1 Static analysis to identify defects in grammars Public/Granted day:2006-12-14
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