Invention Grant
- Patent Title: Test system and method
- Patent Title (中): 测试系统和方法
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Application No.: US11729604Application Date: 2007-03-29
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Publication No.: US07711996B2Publication Date: 2010-05-04
- Inventor: Andrew Roy , Amit Bakshi , Shlomi Krepner , Eugene Fouxman
- Applicant: Andrew Roy , Amit Bakshi , Shlomi Krepner , Eugene Fouxman
- Applicant Address: US NY Chestnut Ridge
- Assignee: LeCroy Corporation
- Current Assignee: LeCroy Corporation
- Current Assignee Address: US NY Chestnut Ridge
- Agent Gordon Kessler
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F7/02 ; G01R31/28 ; H03M13/00

Abstract:
A method and apparatus for testing a data transfer system. The method comprises the steps of storing a first table, the first table noting at least a time of issuance of at least one command and a time of completion of the command and comparing the time of issuance of the command and the time of completion of the command. A timeout condition is registered if the processor determines that a time longer than a predetermined time elapsed between the time of issuance of the command and the time of completion of the command.
Public/Granted literature
- US20080022169A1 Test system and method Public/Granted day:2008-01-24
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