Invention Grant
US07712009B2 Cyclic redundancy check circuit and semiconductor device having the cyclic redundancy check circuit
有权
循环冗余校验电路和具有循环冗余校验电路的半导体器件
- Patent Title: Cyclic redundancy check circuit and semiconductor device having the cyclic redundancy check circuit
- Patent Title (中): 循环冗余校验电路和具有循环冗余校验电路的半导体器件
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Application No.: US11533169Application Date: 2006-09-19
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Publication No.: US07712009B2Publication Date: 2010-05-04
- Inventor: Masafumi Ito , Tomoaki Atsumi
- Applicant: Masafumi Ito , Tomoaki Atsumi
- Applicant Address: JP Atsugi-shi, Kanagawa-ken
- Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee Address: JP Atsugi-shi, Kanagawa-ken
- Agency: Fish & Richardson P.C.
- Priority: JP2005-273356 20050921
- Main IPC: H03M13/00
- IPC: H03M13/00
Abstract:
An object of the present invention is to provide a CRC circuit with more simple structure and low power consumption. The CRC circuit includes a first shift register to a p-th shift register, a first EXOR to a (p−1)th EXOR, and a switching circuit. A data signal, a select signal, and an output of a last stage of the p-th shift register are inputted to the switching circuit, and the switching circuit switches a first signal or a second signal in response to the select signal to be outputted.
Public/Granted literature
- US20070089028A1 CYCLIC REDUNDANCY CHECK CIRCUIT AND SEMICONDUCTOR DEVICE HAVING THE CYCLIC REDUNDANCY CHECK CIRCUIT Public/Granted day:2007-04-19
Information query
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