Invention Grant
- Patent Title: Plasma processing apparatus with insulated gas inlet pore
- Patent Title (中): 具有绝缘气体入口孔的等离子体处理装置
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Application No.: US11237997Application Date: 2005-09-28
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Publication No.: US07712435B2Publication Date: 2010-05-11
- Inventor: Yu Yoshizaki , Ryu Nakano
- Applicant: Yu Yoshizaki , Ryu Nakano
- Applicant Address: JP Tokyo
- Assignee: ASM Japan K.K.
- Current Assignee: ASM Japan K.K.
- Current Assignee Address: JP Tokyo
- Agency: Knobbe, Martens, Olson & Bear LLP
- Priority: JP2004-280887 20040928
- Main IPC: C23C16/507
- IPC: C23C16/507 ; C23C16/509 ; C23C16/50 ; C23F1/00 ; H01L21/306 ; C23C16/22 ; C23C16/06

Abstract:
A plasma processing apparatus includes: a reaction chamber; two electrodes provided inside the reaction chamber for generating a plasma therebetween, wherein at least one of the electrodes has at least one gas inlet pore through which a gas is introduced into the reaction chamber; and a gas inlet pipe coupled to the gas inlet pore for introducing the gas into the reaction chamber. The gas inlet pipe is grounded and insulated from the gas inlet pore, wherein an insulation member is placed inside the gas inlet pipe and the gas inlet pore.
Public/Granted literature
- US20060137610A1 Plasma processing apparatus with insulated gas inlet pore Public/Granted day:2006-06-29
Information query
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