Invention Grant
- Patent Title: Device for optimization of experimental parameters on synchrotron beam lines
- Patent Title (中): 用于优化同步加速器束线实验参数的装置
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Application No.: US12391740Application Date: 2009-02-24
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Publication No.: US07712960B2Publication Date: 2010-05-11
- Inventor: Ruslan Sanishvili , Robert F. Fischetti
- Applicant: Ruslan Sanishvili , Robert F. Fischetti
- Applicant Address: US IL Chicago
- Assignee: UChicago Argonne, LLC
- Current Assignee: UChicago Argonne, LLC
- Current Assignee Address: US IL Chicago
- Agent Joan Pennington
- Main IPC: A61B6/08
- IPC: A61B6/08 ; G01D18/00 ; G21K1/06 ; G01N23/207

Abstract:
Enhanced methods and a device enabling a plurality of tools for implementing a plurality of procedures for the accurate alignment and calibration of multiple components of the experimental set up at a synchrotron beam line are provided. The device includes an alignment pin or needle for centering a sample rotation axis. The device includes a YAG crystal for visualization of the beam and beam alignment and a metal foil for transmission or fluorescence measurements used for the monochromator calibration. The same, or different foils, or powders, or polymers, can be used for obtaining powder rings for finding the direct beam coordinates, for centering the beamstop on the direct beam and for calibration of the sample-to-detector distance.
Public/Granted literature
- US20100074413A1 DEVICE FOR OPTIMIZATION OF EXPERIMENTAL PARAMETERS ON SYNCHROTRON BEAM LINES Public/Granted day:2010-03-25
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