Invention Grant
- Patent Title: Method of preparing yeast for fermentation test
- Patent Title (中): 酵母发酵试验方法
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Application No.: US10468295Application Date: 2002-02-18
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Publication No.: US07713717B2Publication Date: 2010-05-11
- Inventor: Nobuyuki Hayashi
- Applicant: Nobuyuki Hayashi
- Applicant Address: JP Tokyo
- Assignee: Kirin Beer Kabushiki Kaisha
- Current Assignee: Kirin Beer Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Foley & Lardner LLP
- Priority: JP2001-042051 20010219
- International Application: PCT/JP02/01365 WO 20020218
- International Announcement: WO02/066673 WO 20020829
- Main IPC: A23C9/12
- IPC: A23C9/12 ; A23J1/00 ; A23L1/00 ; A23L1/28 ; C12C7/00 ; C12N1/00 ; C12Q1/02 ; C12C3/12

Abstract:
A method of preparing a yeast usable in a fermentation test for evaluating malt on the laboratory scale whereby more reproducible test data can be obtained regardless of the operation conditions of a plant, etc.; and a medium to be used therein. A yeast for the fermentation test for evaluating malt is prepared by culturing a yeast in a liquid medium containing 0 to 2.5% by weight of glucose, 6.0 to 9.0% by weight of maltose, 0 to 2.5% by weight of sorbitol, 0 to 1.0% by weight of peptone and 0.3 to 1.0% by weight of yeast extract at 10 to 20° C. for 2 to 4 days under shaking (primary culture), then in the medium in an increased amount compared with the primary culture at 10 to 20° C. for 3 or 4 days under shaking (secondary culture), then in the medium in a further increased amount compared with the secondary culture at 8 to 9° C. for 7 to 9 days under stirring until the plats attains 3.0° P. or less (tertiary culture), allowing to stand in a cold room for 3 to 24 hours and then collecting the yeast.
Public/Granted literature
- US20040072329A1 Method of preparing yeast for fermentation test Public/Granted day:2004-04-15
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