Invention Grant
US07714266B2 Method and apparatus for measuring source follower gain in an image sensor array
有权
用于测量图像传感器阵列中源极跟随器增益的方法和装置
- Patent Title: Method and apparatus for measuring source follower gain in an image sensor array
- Patent Title (中): 用于测量图像传感器阵列中源极跟随器增益的方法和装置
-
Application No.: US11652680Application Date: 2007-01-12
-
Publication No.: US07714266B2Publication Date: 2010-05-11
- Inventor: Xiangli Li
- Applicant: Xiangli Li
- Applicant Address: KY Grand Cayman
- Assignee: Aptina Imaging Corporation
- Current Assignee: Aptina Imaging Corporation
- Current Assignee Address: KY Grand Cayman
- Agency: Dickstein Shapiro LLP
- Main IPC: H01J40/14
- IPC: H01J40/14 ; H03G3/20 ; H03F3/04
Abstract:
Disclosed embodiments provide a method and apparatus for measuring the gain of output transistors of pixels in an imager device. Source/drain terminals of the output transistor and a reset transistor are driven with various input voltages to generate pixel output voltages. The slope of a line representing the relationship between the output voltages and the input voltages is determined. A component of the slope corresponding to gain not caused by the output transistor is removed from the slope to determine the gain of the output transistor.
Public/Granted literature
- US20080169414A1 Method and apparatus for measuring source follower gain in an image sensor array Public/Granted day:2008-07-17
Information query
