Invention Grant
- Patent Title: Position-measuring device
- Patent Title (中): 位置测量装置
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Application No.: US11942435Application Date: 2007-11-19
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Publication No.: US07714273B2Publication Date: 2010-05-11
- Inventor: Karsten Saendig
- Applicant: Karsten Saendig
- Applicant Address: DE Traunreut
- Assignee: Dr. Johannes Heidenhain GmbH
- Current Assignee: Dr. Johannes Heidenhain GmbH
- Current Assignee Address: DE Traunreut
- Agency: Kenyon & Kenyon LLP
- Priority: DE102006054780 20061120; DE102007035345 20070727
- Main IPC: G01D5/34
- IPC: G01D5/34

Abstract:
A position-measuring device for generating a reference-pulse signal at at least one reference position includes a scanning unit and also a reflection-measuring graduation displaceable relative thereto in at least one measuring direction. The scanning unit for generating the reference-pulse signal includes a plurality of optical elements, including at least one imaging optics as well as at least two diaphragm structures, which are disposed in a diaphragm plane and have a plurality of diaphragm openings in each case. Furthermore, a light source as well as at least two detector elements are assigned to the scanning unit. The reflection-measuring graduation has a reference marking at the at least one reference position. It includes at least one set of first structure elements, which is arranged in the plane of the reflection-measuring graduation, perpendicular to the measuring direction, periodically at a first transversal periodicity. Furthermore, the reference marking has at least one set of second structure elements, which is arranged in the plane of the reflection-measuring graduation, perpendicular to the measuring direction, periodically at a second, different transversal periodicity. The structure elements are arranged as diffractive structure elements, which, in the measuring direction, optically act like a cylinder lens having a specific focal length and, perpendicular to the measuring direction, act like a deflecting grating having the graduation period.
Public/Granted literature
- US20080117440A1 POSITION-MEASURING DEVICE Public/Granted day:2008-05-22
Information query
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