Invention Grant
- Patent Title: Lithographic apparatus and device manufacturing method
- Patent Title (中): 平版印刷设备和器件制造方法
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Application No.: US11512432Application Date: 2006-08-30
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Publication No.: US07714306B2Publication Date: 2010-05-11
- Inventor: Johannes Hubertus Josephina Moors , Levinus Pieter Bakker , Frank Jeroen Pieter Schuurmans
- Applicant: Johannes Hubertus Josephina Moors , Levinus Pieter Bakker , Frank Jeroen Pieter Schuurmans
- Applicant Address: NL Veldhoven
- Assignee: ASML Netherlands B.V.
- Current Assignee: ASML Netherlands B.V.
- Current Assignee Address: NL Veldhoven
- Agency: Pillsbury, Winthrop Shaw Pittman, LLP
- Main IPC: G21K5/10
- IPC: G21K5/10

Abstract:
A lithographic apparatus includes a radiation source configured to emit radiation to form a radiation beam, the radiation being of a type which can create plasma in a low pressure environment in the apparatus, and an optical component configured to condition the radiation beam, impart the conditioned radiation beam with a pattern in its cross-section to form a patterned radiation beam, project the patterned radiation beam onto a target portion of a substrate, and/or to detect radiation. The optical component is provided with a plasma quenching structure, the plasma quenching structure being configured to provide electron-ion recombination in, on and/or near the optical component.
Public/Granted literature
- US20080054189A1 Lithographic apparatus and device manufacturing method Public/Granted day:2008-03-06
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