Invention Grant
- Patent Title: Single mask via method and device
- Patent Title (中): 单面罩通过方法和装置
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Application No.: US12045555Application Date: 2008-03-10
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Publication No.: US07714446B2Publication Date: 2010-05-11
- Inventor: Paul M. Enquist
- Applicant: Paul M. Enquist
- Applicant Address: US NC Morrisville
- Assignee: Ziptronix, Inc.
- Current Assignee: Ziptronix, Inc.
- Current Assignee Address: US NC Morrisville
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Main IPC: H01L23/52
- IPC: H01L23/52 ; H01L23/48 ; H01L29/40 ; H01L23/498 ; H01L25/065 ; H01L25/11

Abstract:
A method of connecting elements such as semiconductor devices and a device having connected elements such as semiconductor devices. A first element having a first contact structure is bonded to a second element having a second contact structure. A single mask is used to form a via in the first element to expose the first contact and the second contact. The first contact structure is used as a mask to expose the second contact structure. A contact member is formed in contact with the first and second contact structures. The first contact structure may have an aperture or gap through which the first and second contact structures are connected. A back surface of the first contact structure may be exposed by the etching.
Public/Granted literature
- US20080150153A1 SINGLE MASK VIA METHOD AND DEVICE Public/Granted day:2008-06-26
Information query
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