Invention Grant
US07715006B2 Optical system for a particle analyzer and particle analyzer using same
有权
用于粒子分析仪的光学系统和使用它的粒子分析仪
- Patent Title: Optical system for a particle analyzer and particle analyzer using same
- Patent Title (中): 用于粒子分析仪的光学系统和使用它的粒子分析仪
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Application No.: US11881323Application Date: 2007-07-26
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Publication No.: US07715006B2Publication Date: 2010-05-11
- Inventor: Seiichiro Tabata
- Applicant: Seiichiro Tabata
- Applicant Address: JP Kobe
- Assignee: Sysmex Corporation
- Current Assignee: Sysmex Corporation
- Current Assignee Address: JP Kobe
- Agency: Brinks Hofer Gilson & Lione
- Priority: JP2006-209263 20060731
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01N33/48

Abstract:
A compact optical system for a particle analyzer and particle analyzer using same are provided. The optical system for a particle analyzer of the present invention comprises a light source, an irradiation optical system for irradiating particles passing through a flow cell with light from the light source, a photodetector for receiving the scattered light from the particles, a light shielding member for blocking the direct light from the light source from impinging the photodetector, and a detecting lens for directing the scattered light toward the photodetector, wherein the irradiation optical system forms a first focus that focuses the light from the light source on the particle passing through the flow cell, and forms a second focus that focuses the light from the light source at a position between the detecting lens and photodetector, and disposes the light shielding member at the position of the second focus.
Public/Granted literature
- US20080024758A1 Optical system for a particle analyzer and particle analyzer using same Public/Granted day:2008-01-31
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