Invention Grant
- Patent Title: Method for measuring density, printing method, method of calculating correction value, method of manufacturing printing apparatus and method for obtaining correction value
- Patent Title (中): 密度测定方法,印刷方法,校正值的计算方法,印刷装置的制造方法以及获得校正值的方法
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Application No.: US11412936Application Date: 2006-04-28
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Publication No.: US07715069B2Publication Date: 2010-05-11
- Inventor: Tatsuya Nakano , Masahiko Yoshida , Keigo Yamasaki
- Applicant: Tatsuya Nakano , Masahiko Yoshida , Keigo Yamasaki
- Applicant Address: JP Tokyo
- Assignee: Seiko Epson Corporation
- Current Assignee: Seiko Epson Corporation
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP2005-133699 20050428; JP2005-133701 20050428
- Main IPC: H04N1/46
- IPC: H04N1/46

Abstract:
A method for measuring density, includes: forming on a medium a pattern that consists of a plurality of dot rows formed respectively in a plurality of row regions lined up in a direction intersecting a movement direction in which a plurality of nozzles move, by forming each of the dot rows in the row region arranged in the movement direction by ejecting ink from the nozzles; reading the pattern by a scanner; measuring density of each of the row regions of the read pattern; calculating respective modification values corresponding to each of the row regions, based on at least a part of a measurement result of the density of the plurality of the row regions; and modifying respective measured values of the density of each of the row regions based on the respective modification values corresponding to each of the row regions.
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