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US07715234B2 Reducing effects of program disturb in a memory device 有权
减少存储器件中程序干扰的影响

Reducing effects of program disturb in a memory device
Abstract:
A selected word line that is coupled to cells for programming is biased with an initial programming voltage. The unselected word lines that are adjacent to the selected word line are biased at an initial Vpass. As the quantity of program/erase cycles on the memory device increases, the programming voltage required to successfully program the cells decreases incrementally. Vpass tracks the decrease of the programming voltage.
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