Invention Grant
- Patent Title: Reducing effects of program disturb in a memory device
- Patent Title (中): 减少存储器件中程序干扰的影响
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Application No.: US12170543Application Date: 2008-07-10
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Publication No.: US07715234B2Publication Date: 2010-05-11
- Inventor: Seiichi Aritome , Todd Marquart
- Applicant: Seiichi Aritome , Todd Marquart
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Leffert Jay & Polglaze P.A.
- Main IPC: G11C16/04
- IPC: G11C16/04

Abstract:
A selected word line that is coupled to cells for programming is biased with an initial programming voltage. The unselected word lines that are adjacent to the selected word line are biased at an initial Vpass. As the quantity of program/erase cycles on the memory device increases, the programming voltage required to successfully program the cells decreases incrementally. Vpass tracks the decrease of the programming voltage.
Public/Granted literature
- US20080291730A1 REDUCING EFFECTS OF PROGRAM DISTURB IN A MEMORY DEVICE Public/Granted day:2008-11-27
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