Invention Grant
- Patent Title: Jitter measurement apparatus, jitter measurement method, and recording medium
- Patent Title (中): 抖动测量装置,抖动测量方法和记录介质
-
Application No.: US11535279Application Date: 2006-09-26
-
Publication No.: US07715512B2Publication Date: 2010-05-11
- Inventor: Kiyotaka Ichiyama , Masahiro Ishida , Takahiro Yamaguchi
- Applicant: Kiyotaka Ichiyama , Masahiro Ishida , Takahiro Yamaguchi
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Agency: Sterne, Kessler, Goldstein & Fox P.L.L.C.
- Main IPC: H04L7/00
- IPC: H04L7/00 ; H04L25/00 ; H04L25/40

Abstract:
A jitter measurement apparatus measures a jitter of a data signal having a substantially constant data rate. The jitter measurement apparatus includes therein a signal converting section that generates a clock signal based on the data signal, where the clock signal retains timings of data transition edges of the data signal at which a data value of the data signal transits and has edges whose cycle is substantially equal to the data rate, an analytic signal generating section that generates an analytic signal represented by a complex number based on the clock signal, and a jitter measuring section that measures the jitter of the data signal based on the analytic signal.
Public/Granted literature
- US20080077342A1 JITTER MEASUREMENT APPARATUS, JITTER MEASUREMENT METHOD, AND RECORDING MEDIUM Public/Granted day:2008-03-27
Information query