Invention Grant
- Patent Title: Design structure for measurement of power consumption within an integrated circuit
- Patent Title (中): 集成电路内功耗测量的设计结构
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Application No.: US12046501Application Date: 2008-03-12
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Publication No.: US07715995B2Publication Date: 2010-05-11
- Inventor: Kenneth Joseph Goodnow , Clarence Rosser Ogilvie , Nitin Sharma , Sebastian Theodore Ventrone , Charles S. Woodruff
- Applicant: Kenneth Joseph Goodnow , Clarence Rosser Ogilvie , Nitin Sharma , Sebastian Theodore Ventrone , Charles S. Woodruff
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Schmeiser, Olsen & Watts
- Agent Riyon W. Harding
- Main IPC: G06F19/00
- IPC: G06F19/00

Abstract:
An design structure for measuring power consumed during operation of an integrated circuit. The design structure including: a data processing circuit having an input and an output, the data processing circuit configured to generate an output data signal on based on an input data signal; a power measurement circuit configured to measure an amount of electrical power consumed by the processing circuit in generating the output signal from the input signal, the power measurement circuit connected between the processing circuit and a power supply for the processing circuit; and a memory element configured to store a tag containing a value representing the amount of electrical power consumed by the processing circuit in generating the output data signal from the input data signal and either (a) the input data of the input data signal or (b) a pointer to the input data of the input data signal.
Public/Granted literature
- US20090153324A1 DESIGN STRUCTURE FOR MEASUREMENT OF POWER CONSUMPTION WITHIN AN INTEGRATED CIRCUIT Public/Granted day:2009-06-18
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